Parameter | TE | P* | PF MicroShunt | P* | P# | |
---|---|---|---|---|---|---|
SAP mean defect (dB) | Baseline |  − 11.54 ± 0.93 (10.50, 9.70) | n.a |  − 11.17 ± 1.66 (10.20, 6.60) | n.a | 0.892 |
6 months |  − 11.60 ± 1.56 (11.50, 9.50) | 0.407 |  − 11.16 ± 3.82 (10.20, 5.50) | 0.180 | 0.859 | |
12 months |  − 11.57 ± 1.07 (12.60, 9.00) | 0.147 |  − 13.12 ± 4.20 (11.30, 2.60) | 0.868 | 0.914 | |
24 months |  − 10.67 ± 0.91 (11.30, 10.60) | 0.226 |  − 10.40 ± 4.75 (10.80, 3.80) | 0.628 | 0.123 | |
RNFL thickness (µm) | Baseline | 62.79 ± 1.94 (58.50, 26.00) | n.a | 62.62 ± 2.05 (57.00, 22.80) | n.a | 0.545 |
3 months | 61.27 ± 3.05 (58.00, 26.00) | 0.174 | 60.99 ± 2.02 (57.00, 24.00) | 0.079 | 0.892 | |
6 months | 58.67 ± 2.75 (54.00, 25.00) |  < 0.001 | 60.36 ± 2.00 (57.00, 23.60) | 0.275 | 0.344 | |
12 months | 58.97 ± 2.39 (57.00, 27.50) |  < 0.001 | 60.04 ± 2.10 (60.00, 23.50) | 0.857 | 0.584 | |
24 months | 57.41 ± 1.81 (54.00, 27.00) |  < 0.001 | 60.22 ± 1.98 (60.00, 22.80) | 0.182 | 0.453 |